MP1203
Advanced X-ray spatial and temporal metrology
Informazioni Generali
- Coordinatore:
- CNRS - FRENCH NATIONAL CENTRE FOR SCIENTIFIC RESEARCH (Francia)
- Responsabile ENEA:
- MONTEREALI ROSA MARIA - FSN-TECFIS-MNF (FRASCATI)
- Ruolo ENEA:
- PARTNER
- Sito WEB:
- Sito WEB non disponibile
Descrizione e Attività
Descrizione Generale
Soft 0.03 -1 keV and hard X-rays 1 -100 keV are one of the best tools for probing matter from the macroscopic to the atomic scale thanks to their penetrating power, spectral selectivity and ability to achieve single atom image. Apart from scientific applications, X-rays are everywhere in our daily life, from medicine, security, food safety, environment and cultural heritage. Ultra-intense X-ray free-electron lasers, plasma-based soft X-ray lasers and attosecond high harmonics have strongly changed the X-ray paradigm. Demands on optics and beam metrology are outstripping the conventional X-ray metrology pulled by synchrotron, EUV lithography and solar telescopes. This COST Action will bring together and consolidate a huge infrastructural and facility rich consortium of hundreds of PIs, ERs and ESRs. New synergies between the different groups will induce strong and fast progress in X-ray metrology. Firms and standardization laboratories are well involved. This Action will improve public and private researchers career at all stages, by increasing mobility and exchange. Five working groups will be set: “X-ray spatial metrology of optics”, “Spatial and temporal metrology of X-ray sources”, “X-ray coherent and incoherent imaging diagnostics”, “Damage on X-ray optics”, “High brightness and coherent X-ray sources for advanced spatial and temporal metrology”.
Attività svolta da ENEA
EnEA participates in Working Groups 2-3:
• WG2: spatial and temporary metrology of X-ray sources:
Diagnostics of X-ray sources and optics by using high resolution solid state imaging LiF detectors as a new tool for metrology).
• WG3: X-ray coherent and incoherent imaging diagnostics
High spatial resolution X-ray coherent and incoherent imaging in absorption and in phase contrast mode by using innovative and versatile solid state imaging LiF detectors as a new tool for microscopy even by lens-less techniques.
Investigation of photo luminescent patterns based on point defects in insulation materials produced by Euv and x-ray lithography for photonics applications.
Programmi Europei
- Programma:
- Other programmes → COST (N/A - Non applicabile)
Dati Finanziari (in euro)
Costo Eleggibile
- Progetto:
- 72.000.000,00
- ENEA:
- N/D
Contributo
- Al progetto:
- N/D
- A ENEA:
- N/D
Durata del Progetto
- Anno di stipula e Durata:
- 2013 - N/D
- Periodo:
- 01-01-2013 → 15-11-2016
Numero di Partner (2)
Keyword associate al progetto dal database di CORDIS (1)
Altre Keyword non presenti nel database di CORDIS (3)
Partecipano per l'ENEA le unità UTAPRAD-MNF e UTTMAT-OTT. Azione Concertata, che non prevede assegnazione preventiva di budget al singolo partner; l'importo assegnato a ciascun partner sarà determinato a consuntivo.